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Laboratory Atomic Absorption Spectrometer Factories - X-Ray Fluorescence spectrometer – NANBEI

Laboratory Atomic Absorption Spectrometer Factories - X-Ray Fluorescence spectrometer – NANBEI

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Laboratory Atomic Absorption Spectrometer Factories - X-Ray Fluorescence spectrometer – NANBEI Detail:

Applications

Quality and Technical Supervision Bureau (Environmental Directive)
RoHS/Rohs (China)/ELF/EN71
Toy
Paper, ceramics, paint, metal, etc.
Electrical and electronic materials
Semiconductors, magnetic materials, solder, electronic parts, etc.
Steel, non-ferrous metals
Alloys, precious metals, slag, ore, etc.
chemical industry
Mineral products, chemical fibers, catalysts, coatings, paints, cosmetics, etc.
environment
Soil, food, industrial waste, coal powder
Oil
Oil, lubricating oil, heavy oil, polymer, etc.
other
Coating thickness measurement, coal, archaeology, material research and forensics, etc..

Features

● Three different types of X-ray radiation safety systems, software interlocks,hardware interlocks, and mechanical interlocks, will completely eliminate radiation leakage under any working condition.
● The XD-8010 features a uniquely designed optical path that minimizes distances between the X-ray source, sample, and detector while maintaining the flexibility to switch between a variety of filters and collimators. This significantly improves the sensitivity, and lowers the detection limit.
● The large volume sample chamber allows large samples to be directly analyzed without the need for damage or pre-treatment.
● Simple, one-button analysis using a convenient and intuitive software interface. Professional training is not required to perform basic operation of the instrument.
● The XD-8010 provides rapid elemental analysis of elements from S to U, with adjustable analysis times.
● Up to 15 combinations of filters and collimators. Filters of various thicknesses and materials are available, as well as collimators ranging from Φ1 mm to Φ7 mm.
● The powerful report formatting feature allows for flexible customization of the automatically generated analysis reports. The generated reports can be saved in PDF and Excel formats. The analysis data is automatically stored after each analysis.Historical data and statistics can be accessed at any time from a simple query interface.
● Using the instrument’s sample camera, you can observe the position of the sample relative to the focus of the X-ray source. Pictures of the sample are taken when analysis begins and can be displayed in the analysis report.
● The software’s spectra comparison tool is useful for qualitative analysis and material identification and comparison.
● By using proven and effective methods of qualitative and quantitative analysis, the accuracy of the results can be assured.
● The open and flexible calibration curve fitting feature is useful for a variety of applications such as the detection of harmful substances.

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Harmful element analysis method

Hazardous Substances Example
Screening Analysis Detailed analysis
Hg X-ray spectroscopy AAS
Pb
Cd
Cr6+ X-ray spectroscopy(Analysis of total Cr) Ion chromatography
PBBs / PBDEs X-ray spectroscopy(Analysis of total Br) GC-MS

Quality Management Process

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Application Examples

Measurement of harmful trace element in polyethylene samples, such as Cr, Br, Cd, Hg and Pb.
• The difference of given values and the actual values of Cr, Br, Cd, Hg and Pb.
The difference of given values and the actual values of Cr, (Unit: ppm)

Sample Given Value Actual Value (XD-8010)
Blank 0 0
Sample 1 97.3 97.4
Sample 2 288 309.8
Sample 3 1122 1107.6

The difference of given values and the actual values of Br, (Unit: ppm)

Sample Given Value Actual Value (XD-8010)
Blank 0 0
Sample 1 90 89.7
Sample 2 280 281.3
Sample 3 1116 1114.1

The difference of given values and the actual values of Cd, (Unit: ppm)

Sample Given Value Actual Value (XD-8010)
Blank 0 0
Sample 1 8.7 9.8
Sample 2 26.7 23.8
Sample 3 107 107.5

The difference of given values and the actual values og Hg, (Unit: ppm)

Sample Given Value Actual Value (XD-8010)
Blank 0 0
Sample 1 91.5 87.5
Sample 2 271 283.5
Sample 3 1096 1089.5

 

The difference of given values and the actual values of Pb, (Unit: ppm)

Sample Given Value Actual Value (XD-8010)
Blank 0 0
Sample 1 93.1 91.4
Sample 2 276 283.9
Sample 3 1122 1120.3

 

The repeated measurement data of sample 3 Cr1122ppm, Br116ppm, Cd10ppm, Hg1096ppm, Pb1122ppm (Unit: ppm)

Cr Br Cd Hg Pb
1 1128.7 1118.9 110.4 1079.5 1109.4
2 1126.2 1119.5 110.8 1072.4 1131.8
3 1111.5 1115.5 115.8 1068.9 1099.5
4 1122.1 1119.9 110.3 1086.0 1103.0
5 1115.6 1123.6 103.9 1080.7 1114.8
6 1136.6 1113.2 101.2 1068.8 1103.6
7 1129.5 1112.4 105.3 1079.0 1108.0
Average 1124.3 1117.6 108.2 1076.5 1110.0
Standard deviation 8.61 4.03 4.99 6.54 10.82
RSD 0.77% 0.36% 4.62% 0.61% 0.98%

Secondary filter for Pb element (Steel substrate samples), Sample: Steel (Pb 113ppm)

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Working Principle

1.X-ray radiation from the primary X-ray tube, is irradiated through a collimator to the sample.
2.Primary X-ray excitation characteristics of the elements contained in the sample X-rays through the secondary collimator into the detector
3.Processed through the detector, forming fluorescence spectroscopy data
4.Computer spectroscopy data analysis, qualitative and quantitative analysis is completed

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Technical Parameters

Model NB-8010
Analysis
principle
Energy dispersive X-ray fluorescence
analysis
Elements Range S (16)
>– U (92) any element
Sample Plastic / metal / film / solid /
liquid / powder, etc.,  any size and irregular shape
X – ray tube Target Mo
Tube voltage (5-50)kV
Tube current (10-1000)uA
Sample irradiation
diameter
F1mm-F7mm
Filter 15 sets of composite filter is
automatically selected, and the automatic conversion
Detector Imports from the United States
Si-PIN detector
The data processing
circuit board
Imports from the United States, with
the use of Si-PIN detector sets
Sample
observation
With 300,000-pixel CCD camera
The sample chamber
size
490 (L)´430 (W)´150 (H)
Analysis method Linear linear, quadratic Code lines,
strength and concentration calibration correction
Operating system
software
Windows XP, Windows7
Data management Excel data management, test reports,
PDF / Excel format saved
Working
environment
Temperature: £30°C. Humidity£70%
Weight 55kg
Dimensions 550´450´395
Power supply AC220V±10%,50/60Hz
Determination
conditions
Atmospheric environment

Product detail pictures:

Laboratory Atomic Absorption Spectrometer Factories - X-Ray Fluorescence spectrometer – NANBEI detail pictures

Laboratory Atomic Absorption Spectrometer Factories - X-Ray Fluorescence spectrometer – NANBEI detail pictures


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  • The factory technical staff not only have high level of technology, their English level is also very good, this is a great help to technology communication.
    5 Stars By Dale from Cannes - 2018.09.19 18:37
    We have been cooperated with this company for many years, the company always ensure timely delivery ,good quality and correct number, we are good partners.
    5 Stars By Miriam from Hongkong - 2018.07.12 12:19
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